The University of Arizona

SEMINAR NOTICE

Three dimensional Structural and Compositional Imaging Using Focus Ion Beam (FIB) - Scanning Transmission Electron Microscopy (STEM) System

Speaker: Toshie Yaguchi, Hitachi High-Technologies Corp.
Date: Monday, August 11, 2008
Time: 10:00AM - 11:00AM
Location: Life Sciences South 240
Cost: FREE, Open to all interested.

Download the seminar notice.

Both in biological applications and materials characterization fields, demands for three dimensional (3D) structural and elemental analyses of a specific site are increasing rapidly. Hitachi has developed a 3D structural and compositional analysis technique using a focused ion beam (FIB) system and scanning transmission electron microscope (STEM). This seminar will introduce the FIB-STEM System and electron energy loss spectroscopy (EELS) as an analysis example.

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Announcements

Posted by Admin on December, 2010

***USIF Offers Custom SEM Training*** We now offer the SEM Short Course on a one-to-one basis. To inquire, email Steven Hernandez.

 

University Spectroscopy and Imaging Facilities
520-621-5097