The University of Arizona

USIF Short Course

Scanning Electron Microscopy

June 16 - June 20, 2008

The short course will meet in Mines 133, 10:00-12:00, for lecture sections. Lab sessions will meet in Marley Suite 101, 1:00-4:00 PM. Students will be required to pass a practical examination on an instrument before they will be allowed access to schedule time and operate the instrument. This course or equivalent is required for researchers to access the USIF scanning electron microscopes.

Cost: $1250.00 Paid in advance. Includes 4 hours of supervised instrument time on students own research samples during 6/23/08-6/27/08. A minimum of four students is required for the course to be offered.


6/16 AM SEM Basics, Electron Optics
6/16 PM Operation Procedures
6/17 AM Electron Beam/Sample Interactions, Contrast Mechanisms
6/17 PM Practical SEM Operations
6/18 AM Field-Emission SEM, Low Voltage, Ultra-High Resolution
6/18 PM Low Voltage, High Resolution, Variable Pressure
6/19 AM Variable Pressure, Sample Preparation
6/19 PM STEM, Energy Filtered Detector, Problem Samples
6/20 AM X-ray Analysis in SEM, CL, Raman, EBSD
6/20 PM X-ray Analysis, Elemental Imaging
6/23 - 6/27 Individual Time with a USIF Staff

To REGISTER, Contact:


Posted by Admin on December, 2010

***USIF Offers Custom SEM Training*** We now offer the SEM Short Course on a one-to-one basis. To inquire, email Steven Hernandez.


University Spectroscopy and Imaging Facilities