The University of Arizona

Scanning Electron Microscopy Short Course

July 16 - July 21, 2009


  • 11:00AM-5:00PM
  • Lab: USIF (Marley 101)

Students will be required to pass a practical examination and certify on an instrument before they will be allowed access to schedule time and operate the USIF scanning electron microscope on their own. Students unable to certify on an instrument may access USIF instruments with assistance from USIF staff members.

Course Objectives:

This course is designed to introduce the basic theory, fundamental operating principles and general specimen preparation techniques used in scanning electron microscopy. Students will be familiarized with the operating modes of the scanning electron microscope, the energy dispersive X-ray system and the basic imaging techniques to certify them for operating the USIF SEM of choice. Separate advanced workshops will be offered for EDS, image processing, QuartzPCI Software Package at another time.


  • SEM Basics, Electron Microscope Optics
  • Detectors and Capabilities
  • Field-Emission SEM, Low Voltage, Ultra-High Resolution
  • Low Voltage, High Resolution, Variable Pressure
  • Electron Beam/Sample Interactions, Contrast Mechanisms
  • Introduction to X-ray Analysis in SEM, Elemental Imaging, CL, PL, Raman, and EBSD Capabilities
  • Hands-on Specimen (materials) Preparation
  • Hands-on Hitachi Microscope Software Operation
  • Hands-on Microscope Operation

Cost: $1250.00


Posted by Admin on December, 2010

***USIF Offers Custom SEM Training*** We now offer the SEM Short Course on a one-to-one basis. To inquire, email Steven Hernandez.


University Spectroscopy and Imaging Facilities